ABUFALGHA, Mohamed. Using Memristor Element to Improve the Reliability of Digital Circuits. The International Journal of Engineering & Information Technology (IJEIT), [S. l.], v. 8, n. 2, p. 38–43, 2024. DOI: 10.36602/ijeit.v8i2.146. Disponível em: http://ijeit.misuratau.edu.ly/index.php/ijeit/article/view/146. Acesso em: 21 dec. 2024.